EOS / Carbonization and power devices

EOS carbonization: preserving clues in the failure region

Staged opening around carbonized and locally damaged areas preserves observable features of die surfaces and bonding regions after electrical overstress.

EOS carbonization: preserving clues in the failure region

Sample and analysis objective

Failed encapsulation materials may respond differently from normal samples. Preparation must consider carbonized regions, die surfaces and bond connections together, avoiding further removal without intermediate records.

ItemCase information
Sample conditionFailed samples associated with EOS carbonization
Observation targetsDie surfaces, bonding regions and local anomalies
Time and yieldNo statistics provided in the source

Processing record

The source shows internal structures of a power package and a separate set of localized die-surface anomalies. These images are not a continuous before-and-after sequence of one sample and do not establish the order in which defects formed.

Actual sample images

Actual die and bonding-region image after opening a power package.
Actual die and bonding-region image after opening a power package.
A local surface area from another sample group, showing the anomaly location and surrounding structures.
A local surface area from another sample group, showing the anomaly location and surrounding structures.

Result review priorities

  • Correlate electrical, X-ray or other available localization clues before preparation.
  • Retain stage images to distinguish original failure evidence from potential preparation effects.
  • Determine the cause of visual anomalies through further analysis, not color or morphology alone.

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